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Product details
  • Component for the Opens test, for capacitive testing of semiconductor chips for open circuits, short circuits and soldering faults
  • Suitable for all Keysight 307x test systems with software version 9.2 or higher
  • Improved repeating accuracy, test coverage and error detection in comparison to VTEP technology

Other products in this series:

Technical data
  • Stroke: 2 mm [.078 in]
  • Length: 155 mm [6.1 in]
  • Outer dimensionS (WxDxH): 155 x 12.8 x 37.8 mm [6.1 x .503 x 1.48 in]
  • Product group: Opens tests
  • Series: OTU
  • Type: Keysight Vectorless Test
  • Version: nanoVTEP SP connector
  • Accessory type: Customising accessories
  • Scope of delivery: Includes nanoVTEP amplifier, GKS
  • Width: 12.8 mm [.503 in]
  • Height: 37.8 mm [1.48 in]
  • Min. temperature: 10 °C [50 °F]
  • Max. temperature: 60 °C [140 °F]
  • RoHS-compliant: Yes
  • Vacuum test fixtures (VA): VA 3070S/L, VA 2070S/L
  • Interchangeable kits (WS): WS Keysight
Suitable tools and accessories
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